Fully Programmable Memory BIST for Commodity DRAMs
نویسندگان
چکیده
3⁄4 In order to accomplish a high speed test on low speed Automatic Test Equipment (ATE), a new instruction based, fully programmable memory, Built-in Self-Test (BIST) is proposed. The proposed memory BIST generates a high speed internal clock signal by multiplying the external low speed clock signal from the ATE. For maximum programmability and small area overhead, the proposed BIST receives test algorithms from the external ATE and stores them as a unique set of instructions, as well as test sequences of unique instructions. An external ATE is able to provide complicated and hard-toimplement functions, such as loop operations and refreshinterrupts, instead of implementing them into the memory BIST, thereby simplifying the BIST hardware structure. The proposed memory BIST is a practical test solution for reducing the overall test cost for the mass production of commodity DDRx SDRAMs. Keywords3⁄4 Built-in self-test, DRAM, low cost, at-speed test.
منابع مشابه
Autonomous Built-in Self-Test Methods for SRAM Based FPGAs
Built-in Self-Test (BIST) approaches for Static Random Access Memory (SRAM) based Field Programmable Gate Arrays (FPGAs) must be capable of fully testing the resources in the device. A summary of current techniques is presented in this paper that covers the three main components of modern FPGAs: logic blocks, interconnects and embedded FPGA cores. Overhead requirements, coverage capability, tra...
متن کاملA New Approach to Programmable Memory Built-In Self Test Scheme
The design and architecture of a reconngurable memory BIST unit is presented. The proposed memory BIST unit could accommodate changes in the test algorithm with no impact to the hardware. Diierent types of march test algorithms could be realized using the proposed memory BIST unit and the proposed architecture allows addition and elimination of the memory BIST components. Therefore memories wit...
متن کاملBIST for Logic and Memory Resources in Virtex-4 FPGAs
We present a Built-In Self-Test (BIST) approach for testing and diagnosing the programmable logic and memory resources in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The resources under test include the programmable logic blocks (PLBs) and block random access memories (RAMs) in all of their modes of operation. The BIST architecture and configurations needed to completely test...
متن کاملOn-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices
On-chip Built-In Self-Test (BIST) based diagnosis of the embedded Field Programmable Gate Array (FPGA) core in a generic System-on-Chip (SoC) is presented. In this approach, the embedded processor core in the SoC is used for reconfiguration of the FPGA core for BIST, initiating the BIST sequence, retrieving the BIST results, and for performing diagnosis of faulty programmable logic blocks, memo...
متن کاملAn Effective Programmable Memory BIST for Embedded Memory
This paper proposes a micro-code based Programmable Memory BIST (PMBIST) architecture that can support various kinds of test algorithms. The proposed Non-linear PMBIST (NPMBIST) guarantees high flexibility and high fault coverage using not onlyMarch algorithms but also non-linear algorithms such as Walking and Galloping. This NPMBIST has an optimized hardware overhead, since algorithms can be i...
متن کامل